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Automated CMM stylus cleaning

LK Metrology News Styli Cleaner

After detailed research into the effects of stylus tip contamination on metrology when using a coordinate measuring machine (CMM), Dr Simon Lawes, Manufacturing Metrology Team, University of Nottingham confirms: “A stylus tip contaminated with tiny particles can lead to measurement errors 10 times greater than the expected.” The problem in inspection rooms and on the […]